SEM image showing contamination on the surface of a component in an electrical switch assembly. Contamination analysis is conducted to determine the chemical make up and ID of the contaminants to identify the source.

Rockwell A |
Rockwell B |
Rockwell C |
Rockwell |
Rockwell |
Brinell |
Microhardness |
Vickers |
Knoop |
Shore A & D |

